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النشرة الإخبارية Test chamber for xenon lamps

Xenon lamp test chamber is an important means to extract formulas and optimize product composition in the process of scientific research and production, and it is also an important part of product quality. Applied materials such as: coatings, plastics, aluminium-plastic panels, paints and automotive safety/safety glass and other product standards require weather resistance testing.

Both the Xenon Lamp Test Chamber and the Xenon Lamp Aging Test Chamber can simulate all spectra of sunlight, including visible light, infrared (IR), and ultraviolet (UV) light. 250-800nm, maximally reproduce the aging mechanism of sunlight. It can be set to expose the tested sample to a light environment equivalent to summer noon for 24 hours. Compared with the actual outdoor environment, the average light intensity is strongker The average exposure time is longer, so the test results can be obtained quickly. Irradiation intensity 300-600W/M2 adjustable, irradiance adjustment: microcomputer + PID + digital power supply + xenon lamp stepless adjustment.

Technical parameters:

1. Blackboard temperature range: (room temperature +10°C) ~ 100°C adjustable

2. Temperature variation: ±0.5℃

3. Temperature uniformity: ≤±2℃

4. Humidity range: 45%R.H ~ 75%R.H adjustable

5. Humidity deviation: +2%R.H-3%R.H

6. Distance from arc center to pallet: adjustable from 200 to 500mm

7. Dark cycle, irradiation cycle: 0 ~9999H adjustable

8. Rain cycle: 0~9999min adjustable

9. Box material: Liner material: heat-resistant and cold-resistant stainless steel plate Outer tank material: colored steel plate electrostatic spraying

10 .Microcomputer control: 5.7 inchl, 640 × 480 dot matrix, TFT color LCD display

11. Operating mode: support program mode , fixed value mode

12. Setting mode: Chinese and English menu (optional) touch screen input

13. Program capacity: 120 program groups, 14400 segments, cycle number can be repeated endlessly

14. Waveform recording function: It has a PAM with battery protection, which records the set value, sampling value and sampling time of the device. The recording time is 180 days (when sampling cycle is 60S)

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