Chip Thermal Shock Test Chamber is a kind of test equipment that simulates the rapid temperature changes in nature, which can test the product through the process of rapid temperature change The physical and chemical damage suffered in the product to discover the potential quality problems of the product and then improve and optimize it.
Chip Thermal Shock Test Box Mainly in industries such as plastics for electronic and electrical components, national defense industriese, military industry, aerospace, BGA, PCB base plate, automation parts, communication components, auto parts, metals, chemical materials, electronic chip ICs uses physical changes of semiconductor ceramics and polymer materials are tested to confirm the product's performance in the environment . It is used to test the material structure or composite material that can withstand the continuous high temperature and ultra low temperature environment in an instant to test the chemical change or physical change caused by thermal expansion and contraction in the shortest possible time.
The performance parameters relate to the following:
1. Temperature range for low temperature influence: A-20℃; B-40℃; C: 55℃; D: -65℃ (manufacturer also provides free high temperature up to 150℃).
Second, temperature deviation : ±2℃.
3. Temperature variation: ±0.5℃.
4. Temperature recovery time: ≤5min.< p style=margin-top: 0px;margin-bottom: 0px; padding: 0px; color: rgb(85, 85, 85); size: 12 pixels; space: normal; Font family: Microsoft Yahei !important;>5. Temperature recovery
Conditions: High temperature at 150 ° C for 30 minutes, low temperature at -20 °C for 30 minutes, high temperature at 150 °C for 30 minutes, low temperature at -40 °C for 30 minutes, high temperature at 150 °C for 30 minutes, low temperature at -55°C for 30 minutes, high temperature at 150°C for 30 minutes Expose at -65°C for 30 minutes.
6. Thermal shock transmission method: pneumatic drive.
7. Heating time for high temperature storage: 30min (+25℃～+200℃).
8 . The cooling time of the low-temperature storage room: 65 min (+25℃～-75℃).
Nine, Low-temperature impact testing machine | Low-temperature impact testing machine | Impact testing machine Operating noise: (dB) ≤ 65 (the standard stipulates that ≤ 65 decibels are not counted as noise)< p style= Top Margin: 0px; margin below: 0px; Padding: 0px; Color: rgb(85, 85, 85); Font size: 12px; white space: normal; Font family: Microsoft Yahei !important ;>
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